首页> 外国专利> Multi-resolution detection for incresing resolution in an x-ray imaging implementation of an object

Multi-resolution detection for incresing resolution in an x-ray imaging implementation of an object

机译:用于在对象的X射线成像实现中提高分辨率的多分辨率检测

摘要

The present invention discloses a multi-resolution detector for use in an x-ray imaging implementation such as computed tomography and digital radiography. The multi-resolution detector (16) includes a two-dimensional, mxn element array of low resolution detector elements and at least one high resolution detector element located about the two-dimensional, mxn element array of low resolution detector elements. After an object (14) has been completely scanned with the multi-resolution detector, the scan data from both the two-dimensional, mxn element array of low resolution detector elements and the high resolution detector element is used to reconstruct a high resolution image. In particular, the scan data generated from the two-dimensional, mxn element array of low resolution detector elements is used along with the initial scan data generated from the high resolution detector element to iteratively construct a high resolution image of the object (14).
机译:本发明公开了一种用于诸如计算机断层摄影和数字射线照相的X射线成像实施中的多分辨率检测器。所述多分辨率检测器(16)包括低分辨率检测器元件的二维m×n元件阵列和位于所述低分辨率检测器元件的二维m×n元件阵列周围的至少一个高分辨率检测器元件。在用多分辨率检测器完全扫描了物体(14)之后,来自低分辨率检测器元件的二维,m×n元件阵列和高分辨率检测器元件的扫描数据都被用于重建高分辨率图像。特别地,将从低分辨率检测器元件的二维,m×n元件阵列产生的扫描数据与从高分辨率检测器元件产生的初始扫描数据一起使用,以迭代地构造物体的高分辨率图像(14)。

著录项

  • 公开/公告号EP1168002A3

    专利类型

  • 公开/公告日2006-06-14

    原文格式PDF

  • 申请/专利权人 GENERAL ELECTRIC COMPANY;

    申请/专利号EP20010121332

  • 发明设计人 HEDENGREN KRISTINA HELENA VAL;

    申请日1997-12-23

  • 分类号G01T1/24;G01T1/29;

  • 国家 EP

  • 入库时间 2022-08-21 21:31:34

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