首页> 外国专利> IMPROVING SHORT CHANNEL EFFECT OF MOS DEVICES BY RETROGRADE WELL ENGINEERING USING TILTED DOPANT IMPLANTATION INTO RECESSED SOURCE/DRAIN REGIONS

IMPROVING SHORT CHANNEL EFFECT OF MOS DEVICES BY RETROGRADE WELL ENGINEERING USING TILTED DOPANT IMPLANTATION INTO RECESSED SOURCE/DRAIN REGIONS

机译:通过将倾斜的掺杂物注入到源/漏区中的掺杂井工程改造井工程,提高MOS设备的短通道效应

摘要

A method of providing a halo implant region in a substrate of a MOS device having a gate electrode thereon and defining source/drain regions, a MOS device fabricated according to the above method, and a system comprising the MOS device. The method comprises: defining undercut recesses in the substrate at the source/drain regions thereof, the undercut recesses extending beneath the gate electrode; creating a halo implant region beneath the gate electrode between the recesses; and providing raised source/drain structures in the undercut recesses after creating the halo implant region.
机译:一种在其上具有栅电极并限定源/漏区的MOS器件的衬底中提供晕圈注入区的方法,根据上述方法制造的MOS器件以及包括该MOS器件的系统。该方法包括:在衬底的源/漏区处在衬底中限定底切凹槽,该底切凹槽在栅电极下方延伸;以及在凹部之间的栅电极下方创建晕环注入区域;在产生光晕注入区之后,在底切凹槽中提供凸起的源极/漏极结构。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号