Detection of a twodimensional diffraction pattern by rotation of a one dimensional position sensitive detector

摘要

Detector arrangement for measuring X-ray and neutron radiation scattered from a sample (2) has a one-dimensional detector (3) in the form of a particle or photon detector that extends a long a detection line (4), that is essentially perpendicular to a line (5) between the sample and the detector. The detector rotates around an axis (6) parallel to the scatter direction so that a 2D-diffraction pattern can be recorded. The invention also relates to a corresponding method for operating an X-ray or neutron diffractometer comprising an inventive detector arrangement.