首页> 外国专利> OPTICAL WAVEFORM MEASUREMENT DEVICE AND MEASUREMENT METHOD THEREOF, COMPLEX REFRACTIVE INDEX MEASUREMENT DEVICE AND MEASUREMENT METHOD THEREOF, AND COMPUTER PROGRAM RECORDING MEDIUM CONTAINING THE PROGRAM

OPTICAL WAVEFORM MEASUREMENT DEVICE AND MEASUREMENT METHOD THEREOF, COMPLEX REFRACTIVE INDEX MEASUREMENT DEVICE AND MEASUREMENT METHOD THEREOF, AND COMPUTER PROGRAM RECORDING MEDIUM CONTAINING THE PROGRAM

机译:光学波形测量装置及其测量方法,复折射指数测量装置及其测量方法以及包含该程序的计算机记录介质

摘要

The present invention relates to a light-waveform measuring device and its measuring method, a complex-refractive-index measuring device and its measuring method, and a computer-program recording medium having programs for the same stored therein. It is an object of the present invention to measure an electric field of an electromagnetic wave in a light region having wavelengths smaller than those of electromagnetic waves in a nearl-infrared region and output time-varying waveforms thereof. It is also an object of the present invention to enable easily obtaining a complex refractive index of a material, on the basis of the result of measurement of the electric-field waveform of light. The present invention comprises gate-pulse-light generating means, measurement-light generating means and light-detecting means for detecting measurement light, wherein both of gate pulse light and measurement light are coherent lights, the measurement light is coherent light having a wavelength smaller than those of a near-infrared region, the gate pulse light has a pulse width smaller than a period of the measurement light, the measurement light and the gate pulse light are directed to the light-detecting means to generate carriers therein, a physical quantity based on the carriers is measured, and an electric field of the measurement light is measured on the basis of the physical quantity.
机译:光波形测定装置及其测定方法,复折射率测定装置及其测定方法以及计算机程序记录介质技术领域本发明涉及光波形测定装置及其测定方法,复折射率测定装置及其测定方法,以及存储有用于其的程序的计算机程序记录介质。本发明的一个目的是测量波长小于近红外区域中的电磁波的波长的光区域中的电磁波的电场,并输出其随时间变化的波形。本发明的另一个目的是基于光的电场波形的测量结果,能够容易地获得材料的复数折射率。本发明包括栅极脉冲光产生装置,测量光产生装置和用于检测测量光的光检测装置,其中,栅极脉冲光和测量光都是相干光,测量光是波长较小的相干光。与近红外区域相比,栅极脉冲光的脉冲宽度小于测量光的周期,测量光和栅极脉冲光被导向光检测装置以在其中产生载流子,物理量测量基于载流子的电场,并基于物理量测量测量光的电场。

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