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Optical Waveform Measurement Device and Measurement Method Thereof, Complex Refractive Index Measurement Device and Measurement Method Thereof, and Computer Program Recording Medium Containing the Program.
Optical Waveform Measurement Device and Measurement Method Thereof, Complex Refractive Index Measurement Device and Measurement Method Thereof, and Computer Program Recording Medium Containing the Program.
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机译:光波形测量装置及其测量方法,复折射率测量装置及其测量方法以及包含该程序的计算机程序记录介质。
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摘要
The present invention relates to a light-waveform measuring device and its measuring method, a complex-refractive-index measuring device and its measuring method, and a computer-program recording medium having programs for the same stored therein. It is an object of the present invention to measure an electric field of an electromagnetic wave in a light region having wavelengths smaller than those of electromagnetic waves in a near-infrared region and output time-varying waveforms thereof. It is also an object of the present invention to enable easily obtaining a complex refractive index of a material, on the basis of the result of measurement of the electric-field waveform of light. The present invention comprises gate-pulse-light generating means, measurement-light generating means and light-detecting means for detecting measurement light, wherein both of gate pulse light and measurement light are coherent lights, the measurement light is coherent light having a wavelength smaller than those of a near-infrared region, the gate pulse light has a pulse width smaller than a period of the measurement light, the measurement light and the gate pulse light are directed to the light-detecting means to generate carriers therein, a physical quantity based on the carriers is measured, and an electric field of the measurement light is measured on the basis of the physical quantity.
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