首页>
外国专利>
SYSTEM AND METHOD OF MONITORING, PREDICTING AND OPTIMIZING PRODUCTION YIELDS IN A LIQUID CRYSTAL DISPLAY(LCD) MANUFACTURING PROCESS
SYSTEM AND METHOD OF MONITORING, PREDICTING AND OPTIMIZING PRODUCTION YIELDS IN A LIQUID CRYSTAL DISPLAY(LCD) MANUFACTURING PROCESS
展开▼
机译:液晶显示(LCD)制造过程中产量的监测,预测和优化的系统和方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
A system and method of monitoring LCD production yields, predicting the effects of different testing methodologies on LCD production yields, optimizing production yields, and detecting defects in TFT-array panels is provided that compares the effect of different testing methodologies on the yields at various stages in the LCD testing and assembly process. The present invention can also be used to predict the effect of different testing methodologies on user- defined parameters, such as profit. The present invention can also detect defects in TFT-array panels with improved defect detection accuracy.
展开▼