The present invention provides a pretreatment method, a pretreatment device, a method and a device for electric inspection of conductor pattern, being capable of promoting the reliability of inspection as well as the product quality. A printed circuit board and a semiconductor device to which the inspection has been completed are also provided. With respect to the pretreatment for electric-inspecting, by each piece, the conductor pattern formed on at least one side of an insulating substrate for printed circuit board, the conduct patterns are inspected by each piece so as to pick out the inferior conductor patterns, and then a conductive substance is applied to the inferior piece to make the inter-wiring which constitutes the inferior conductor pattern short-circuited.
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