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SRAM device employing stable virtual rail scheme against process-voltage-temperature variations

机译:SRAM器件采用稳定的虚拟轨方案,可抵抗过程电压-温度变化

摘要

The present invention is disclosed with respect to the SRAM device according to the virtual rail scheme stable against various PVT variations . The SRAM device has a higher virtual ground supply voltage by the threshold voltage of the transistor from the lower power supply voltage and the virtual ground voltage from the power source voltage by the threshold voltage of the transistor cell in SRAM. By the power supply voltage of the diode type and is connected between the virtual power supply voltage PMOS transistor and NMOS transistor , and a ground voltage and a diode type of the NMOS transistor and PMOS transistor connected between the virtual ground voltage , stable for the various PVT variations virtual power supply voltage and the virtual ground voltage to provide a stable, low leakage current characteristics .
机译:关于根据虚拟轨道方案对各种PVT变化稳定的SRAM器件公开了本发明。 SRAM器件的虚拟接地电源电压比较低的电源电压高出晶体管的阈值电压,而SRAM电源中的虚拟接地电压高于电源中的晶体管单元的阈值电压。通过将二极管类型的电源电压连接在虚拟电源电压PMOS晶体管和NMOS晶体管之间,并将接地电压和二极管类型的NMOS晶体管与PMOS晶体管之间的虚拟接地电压相连,对于各种稳定PVT通过改变虚拟电源电压和虚拟地电压来提供稳定的低泄漏电流特性。

著录项

  • 公开/公告号KR100604876B1

    专利类型

  • 公开/公告日2006-07-31

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20040051525

  • 发明设计人 최재승;송태중;

    申请日2004-07-02

  • 分类号G11C5/14;G11C11/413;

  • 国家 KR

  • 入库时间 2022-08-21 21:23:22

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