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programmable impedance Control circuit in semiconductor device and impedance range shifting method therefor
programmable impedance Control circuit in semiconductor device and impedance range shifting method therefor
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机译:半导体器件中的可编程阻抗控制电路及其阻抗范围转换方法
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摘要
process, supply voltage, preventing the impedance detection failure due to fluctuations in the surrounding environment such as temperature or minimize to programmable impedance control circuit of the semiconductor device having the impedance Flange shifting function it is disclosed. Such a programmable impedance control circuit comprises: a first array drive in response to the control code data, Flange shifting the second drive in response to a data array, for each of the first and second impedance matching it is independently controlled by an array drive transistor and the impedance detector comprises an array Schiff and Flange tingyong transistor array; And a comparison unit for comparing each of the first and second output voltage level and the reference voltage of the impedance detector array and outputting the up-down signal as a comparison resu In response to the up-down signal and a counter for outputting a control code data to turn on or off the P-channel and the increase and decrease counted and Mohs yen channel transistor; By monitoring the output of the counter unit counting Flange Flange and a shift circuit which generates a shifting data. According to the invention, the manufacturing process, the power supply voltage, even if there are environmental changes, such as operating temperature, and the impedance matching for the transistor array of the advantage that the control code can perform the impedance matching and calibration operation without waste.
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