首页>
外国专利>
DEVICE FOR MEASURING MICRO-DISPLACEMENTS
DEVICE FOR MEASURING MICRO-DISPLACEMENTS
展开▼
机译:测量微位移的装置
展开▼
页面导航
摘要
著录项
相似文献
摘要
FIELD: engineering of pressure sensors, acceleration meters, angular speed sensors and micro-gyroscopes.;SUBSTANCE: device is a generator, built on amplifying element with hysteresis, for example, Schmidt trigger. Device has two measuring capacitances, first outputs of which through keys are connected to input of amplifier element. Second outputs of measuring capacitances are connected to common wire. To input of amplifier element additional capacitance is also connected. Between input and output of amplifier element frequency-setting resistor is connected. Full cycle of generator operation includes three modes. In first and second modes by means of keys to input of amplifier element in turns first and second measuring capacitances are connected. In third mode as time-setting capacitance a total of additional and parasitic capacitance is utilized.;EFFECT: improved precision of device due to prevented influence from parasitic capacitances, electrodes area, power voltage, dielectric penetrability of environment on measurement result.;1 dwg
展开▼