3He/4He of 10-5 degree is determined, presence of high electric conductivity is determined at semiconductor level, locality and intensiveness of magnetic anomalies, anomalies of gravity force field, and depth of position of silicides is determined by magnetic-telluric probing and/or seismic methods of reflected and refracted waves.;EFFECT: increased trustworthiness of received information.;6 cl, 4 dwg"/>
公开/公告号RU2279698C2
专利类型
公开/公告日2006-07-10
原文格式PDF
申请/专利权人
申请/专利号RU20040130955
申请日2004-10-22
分类号G01V9/00;G01V11/00;
国家 RU
入库时间 2022-08-21 21:21:38