首页> 外国专利> METHOD FOR INTRODUCING IONS TO BE ANALYZED INTO MASS-ANALYZER WORKING SPACE OF HYPERBOLOID MASS-SPECTROMETER OF THREE-DIMENSIONAL TRAP TYPE

METHOD FOR INTRODUCING IONS TO BE ANALYZED INTO MASS-ANALYZER WORKING SPACE OF HYPERBOLOID MASS-SPECTROMETER OF THREE-DIMENSIONAL TRAP TYPE

机译:将离子引入三维陷阱型双曲面质谱仪的质谱分析仪工作空间中的方法

摘要

FIELD: hyperboloid mass spectrometry; development of high-sensitivity and high-resolution devices of this type.;SUBSTANCE: proposed method for introducing ions to be analyzed includes introduction of ions produced beyond working space into working space of analyzer incorporated in hyperboloid mass-spectrometer of three-dimensional trap type near radial plane through one or more channels provided in circular electrode at certain angle to straight line interconnecting inlet point and center of analyzer electrode system; ions being analyzed are forced in working space of analyzer over paths whose envelopes function as circumferences by controlling angle and relative rate of introduction using relevant correlations.;EFFECT: effective capture of introduced ions enhanced by more than order of magnitude.;1 cl, 3 dwg
机译:领域:双曲面质谱物质:提出的引入待分析离子的方法包括将工作空间以外产生的离子引入到三维阱型双曲面质谱仪中的分析仪工作空间中通过一个或多个设置在圆形电极中的通道以与连接分析仪电极系统的入口点和中心的直线成一定角度的近似径向平面;通过使用相关性控制角度和相对引入速率,迫使被分析离子进入分析仪的工作空间中的路径,其包络线作为圆周;效果:有效捕获引入离子的量提高了一个数量级以上; 1 cl,3 dwg

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