首页> 外国专利> Inspection, measurement and repair system for use in the semiconductor industry combines a manipulator with inspection, measurement and repair modules with the object under test handled using interfaces to the manipulator

Inspection, measurement and repair system for use in the semiconductor industry combines a manipulator with inspection, measurement and repair modules with the object under test handled using interfaces to the manipulator

机译:用于半导体行业的检查,测量和维修系统将机械手与检查,测量和维修模块结合在一起,被测物体通过与机械手的接口进行处理

摘要

Inspection, measurement and repair system for the semiconductor industry has a handling arrangement (1) with a manipulator (3) to which an object is delivered. It has a number of module interfaces (6-9) and a number of inspection, measurement and repair modules (10-12), each with a second module interface (13-15) that can be connected to one of the first interfaces. The manipulator loads and unloads the inspection, measurement and repair modules via the connected interfaces.
机译:半导体工业的检查,测量和维修系统具有操纵装置(1)和操纵装置(3),将物体运送到操纵装置(3)。它具有多个模块接口(6-9)和多个检查,测量和维修模块(10-12),每个模块都具有可连接至第一个接口之一的第二个模块接口(13-15)。机械手通过连接的接口加载和卸载检查,测量和维修模块。

著录项

  • 公开/公告号DE102004033879A1

    专利类型

  • 公开/公告日2006-02-02

    原文格式PDF

  • 申请/专利权人 CARL ZEISS SMS GMBH;

    申请/专利号DE20041033879

  • 发明设计人 PAUSCHINGER DIETER;ENGEL THOMAS;

    申请日2004-07-13

  • 分类号G01M19/00;H01L21/66;

  • 国家 DE

  • 入库时间 2022-08-21 21:20:49

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