首页> 外国专利> Apparatus for scanning probe microscopy for examining biological systems and which automatically analyzes measurements from the device according to predetermined analysis parameters

Apparatus for scanning probe microscopy for examining biological systems and which automatically analyzes measurements from the device according to predetermined analysis parameters

机译:用于扫描探针显微镜的设备,用于检查生物系统,并根据预定的分析参数自动分析设备的测量值

摘要

The apparatus has a scanning microscope measuring device having a measurement probe for microscopic measurements and a probe carrier for positioning a sample to be measured. The apparatus also has a control unit which is connected to the measuring device in a system integrated manner and arranged to automatically control the measuring device to carry out a microscopic measurement according to predetermined control parameters. In addition, or alternatively, the apparatus has an analysis device connected to the measuring device in a system integrated manner and arranged to automatically analyze the measurements according to predetermined analysis parameters. Independent claims also cover a measurement method.
机译:该设备具有扫描显微镜测量装置,该扫描显微镜测量装置具有用于显微测量的测量探针和用于放置要测量的样品的探针载体。该设备还具有控制单元,该控制单元以系统集成的方式连接到测量装置,并且布置成自动控制测量装置以根据预定的控制参数进行显微测量。另外地或可替代地,该设备具有分析装置,该分析装置以系统集成的方式连接至测量装置,并且布置成根据预定的分析参数自动分析测量结果。独立权利要求还涉及一种测量方法。

著录项

  • 公开/公告号DE102004048971B3

    专利类型

  • 公开/公告日2006-05-24

    原文格式PDF

  • 申请/专利权人 NAMBITION GMBH;

    申请/专利号DE20041048971

  • 发明设计人 STRUCKMEIER JENS;SCHLAGENHAUF KARL;

    申请日2004-10-07

  • 分类号G12B21;G01N13/10;G01N33/483;B05D3/12;

  • 国家 DE

  • 入库时间 2022-08-21 21:20:40

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