首页> 外国专利> Test method for testing the quality of a detector module for an X-ray computer tomograph involves measurement of X-radiation with reference and test modules and then comparison and evaluation of their output signals

Test method for testing the quality of a detector module for an X-ray computer tomograph involves measurement of X-radiation with reference and test modules and then comparison and evaluation of their output signals

机译:测试X射线计算机断层扫描仪检测器模块质量的测试方法包括:使用参考模块和测试模块测量X射线,然后比较和评估其输出信号

摘要

Method for testing the quality of a detector module for an X-ray computer tomograph has the following steps: provision of a measurement arrangement including X-ray source (4), reference detector module (3) and recording arrangement (1) in which the detector module to be tested is inserted; irradiation of the reference detector module and the detector (D) containing the under-test detector module and; measurement and comparison of reference and test module signals. The invention also relates to use of a X-ray computer tomograph gantry and test gantry for testing detector modules.
机译:用于测试X射线计算机断层扫描仪的检测器模块的质量的方法具有以下步骤:提供包括X射线源(4),参考检测器模块(3)和记录装置(1)的测量装置,其中插入要测试的探测器模块;照射参考检测器模块和包含被测检测器模块的检测器(D),以及测量和比较参考和测试模块信号。本发明还涉及X射线计算机断层扫描架和测试架在测试检测器模块中的用途。

著录项

  • 公开/公告号DE102004057741A1

    专利类型

  • 公开/公告日2006-06-01

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE20041057741

  • 申请日2004-11-30

  • 分类号G01T1/29;G01N23/06;

  • 国家 DE

  • 入库时间 2022-08-21 21:20:37

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