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Controlling and measuring method for contour of component involves sending marking signals by marker to respective level whereby specified contour lies outside the component with secured specified distance on projected contour
Controlling and measuring method for contour of component involves sending marking signals by marker to respective level whereby specified contour lies outside the component with secured specified distance on projected contour
The method involves sending marking signals by perpendicular marker to respective level. The marker is guided contactless along with electronically controlled specified contour opposite to contour which is to be controlled. The specified contour lies outside the component (1) with a secured specified distance on the projected contour of concerned level. An independent claim is also included for the device for execution of the method.
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