Semiconductor memory unit e.g. dynamic RAM, has I/O skip unit that is erased, when memory cells assigned to data lines are identified as non-functional, and erased skip unit forces error free signal to PF-signal line

摘要

The unit has data lines connected with memory cells of data word groups to transmit data bits stored in the cells. Each data line is assigned to an erasable I/O skip unit (50), where the skip unit is erased, when the cells assigned to the data lines are identified as non-functional. The erased unit forces an error free signal to a corresponding PF-signal line. A non-volatile partial identifier is provided to activate each skip unit. An independent claim is also included for a method for testing a semiconductor wafer with semiconductor memory unit.