首页> 外国专利> Metal wiring layer formation, for integrated circuit, involves forming metal nitride layer in contact hole, such that concentration of metal nitride layer at bottom of hole is less than that of metal nitride layer at opening of hole

Metal wiring layer formation, for integrated circuit, involves forming metal nitride layer in contact hole, such that concentration of metal nitride layer at bottom of hole is less than that of metal nitride layer at opening of hole

机译:用于集成电路的金属布线层的形成涉及在接触孔中形成金属氮化物层,使得在孔的底部的金属氮化物层的浓度小于在孔的开口中的金属氮化物层的浓度。

摘要

A metal nitride layer (540) is formed within a contact hole (522), such that concentration of metal nitride layer at bottom of contact hole is less than that of metal nitride layer at opening of contact hole. A metal layer (550) is formed on the metal nitride layer. An independent claim is also included for metal wiring layer.
机译:在接触孔(522)内形成金属氮化物层(540),使得在接触孔的底部的金属氮化物层的浓度小于在接触孔的开口处的金属氮化物层的浓度。在金属氮化物层上形成金属层(550)。金属布线层也包括独立权利要求。

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