Testing device for memory-capable electronic components with integrated circuits has a contact base with a system block for attaching an electronic component to be tested

摘要

A contact base (CB) (1) has a system block (9), to which an electronic component (EC) (5) to be tested is attached with its connection contacts (CC) (7). Assigned to the CB, a test head (3) is pressed on the CC of the EC with its electric contacts (17) so as to make an electric connection with the EC. An independent claim is also included for a contact base for a device for testing electronic components.