首页> 外国专利> Manipulator for non-destructive materials testing device e.g. X-ray testing device, using 2 independently displaced linear axes for movement of pivot support for testing device

Manipulator for non-destructive materials testing device e.g. X-ray testing device, using 2 independently displaced linear axes for movement of pivot support for testing device

机译:非破坏性材料测试设备的操纵器X射线测试设备,使用2个独立移动的线性轴来移动测试设备的枢轴支撑

摘要

The manipulator has a support (2) to which the materials testing device (4,6) is attached, which pivots about a pivot pin (18) and which is displaced in a longitudinal direction (10,14). The manipulator has 2 linear axes (8,12) to which the support is hinged, which are independently displaced in the longitudinal direction. Also included are Independent claims for the following: (A) a non-destructive materials testing device; (B) a control method for positioning an X-ray testing device via a manipulator.
机译:操纵器具有支架(2),材料测试装置(4,6)附接到该支架(2),该支架绕枢轴销(18)枢转并沿纵向(10,14)移位。操纵器具有2个直线轴(8,12),支座铰接到该直线轴(8,12),它们在纵向方向上独立移动。还包括以下方面的独立权利要求:(A)非破坏性材料测试设备; (B)一种用于通过操纵器定位X射线测试装置的控制方法。

著录项

  • 公开/公告号DE212004000031U1

    专利类型

  • 公开/公告日2006-01-12

    原文格式PDF

  • 申请/专利权人 GE INSPECTION TECHNOLOGIES GMBH;

    申请/专利号DE20042100031U

  • 发明设计人

    申请日2004-05-12

  • 分类号G01B5/00;G01N23/00;

  • 国家 DE

  • 入库时间 2022-08-21 21:19:37

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号