Automatic test pattern generation for functionally register transfer level circuits with the allocation corresponding apparent to those skilled in the diagrams

摘要

Test patterns are generated by generating (105) assignment decision diagrams that represent a register transfer level digital circuit. A nine-valued symbolic algebra is used in which objectives are determined (107) for portions identified in the assignment decision diagram. The objectives are justified and propagated by traversing the assignment decision diagram in which a test environment is found (111). Heuristics are used (115) if a test environment is not initially found. Using the test environment found, predetermined test vectors are propagated (117) to obtain a system-level test set. Each test set for each portion is concatenated (123) to obtain a complete test set for the register transfer level digital circuit.