Electro-optic micrometer for measuring physical magnitude, has control device controlling coherently optical source, detector and processing unit, which process voltage detection signal to provide measurement signal, based on magnitude

摘要

The micrometer has an optical source (EM) electrically controlled to emit light beams comprising wavelengths. An optical detector (DEC) detects a light signal at the wavelengths to provide an electric voltage detection signal that is processed by a processing unit (UT) to provide a measurement signal. A control device (CC) controls in coherence the source, detector and unit (UT) based on magnitude to be measured.