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FAILURE ANALYSIS PROGRAM, RECORDING MEDIUM WITH PROGRAM RECORDED THEREON, FAILURE ANALYSIS METHOD, AND FAILURE ANALYSIS DEVICE
FAILURE ANALYSIS PROGRAM, RECORDING MEDIUM WITH PROGRAM RECORDED THEREON, FAILURE ANALYSIS METHOD, AND FAILURE ANALYSIS DEVICE
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机译:故障分析程序,将程序记录到其中的记录介质,故障分析方法以及故障分析装置
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摘要
PROBLEM TO BE SOLVED: To improve reliability of a semiconductor integrated circuit and shortening its manufacturing period of time.;SOLUTION: Failure analysis device 1100 extracts a partial path containing a failure part from among paths in a circuit to be analyzed by a partial path extraction section 1101, then detects an expansion path from a circuit element at a front stage of a start point of the extracted partial path via the partial path to a circuit element at a rear stage of an end point of the partial path by a path detection section 1102, extracts the shortest expansion path from among a group of the expansion paths by an expansion path extraction section 1103, determines whether the path length of the expansion path is longer than a prescribed reference length by a determination section 1104, and determines the expansion path as a path to be used in failure simulation by a decision section on the basis of the decision results determined by the determination section 1104.;COPYRIGHT: (C)2008,JPO&INPIT
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