首页> 外国专利> INSPECTION DEVICE OF STRIPE-SHAPED IRREGULARITY, INSPECTION METHOD OF STRIPE-SHAPED IRREGULARITY, AND MANUFACTURING METHOD OF FILM

INSPECTION DEVICE OF STRIPE-SHAPED IRREGULARITY, INSPECTION METHOD OF STRIPE-SHAPED IRREGULARITY, AND MANUFACTURING METHOD OF FILM

机译:条纹状不规则物的检查装置,条纹状不规则物的检查方法以及膜的制造方法

摘要

PROBLEM TO BE SOLVED: To provide an inspection device capable of not only discriminating a stripe-shaped defect having a known shape generated on the surface of an inspection object by using an optical procedure but also evaluating quantitatively and highly accurately in a short time a parameter characterizing the shape of the stripe-shaped defect.;SOLUTION: Light having uniqueness to a specific direction is irradiated toward the inspection object, and reflected light or transmitted light from the inspection object generated from the irradiated light is imaged, and the parameter characterizing the shape of the stripe-shaped defect on the surface of the inspection object is determined quantitatively based on an imaging result changing according to inclination of the surface of the inspection object and on a shape model of the stripe-shaped defect on the surface of the inspection object.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:提供一种检查装置,该检查装置不仅能够通过使用光学程序来辨别在检查对象的表面上产生的形状已知的条状缺陷,而且能够在短时间内定量且高精度地评价参数。解决方案:将具有特定方向唯一性的光照射到检查对象,并成像由照射光产生的来自检查对象的反射光或透射光,并且表征该缺陷的参数基于根据检查对象的表面的倾斜度改变的成像结果以及基于检查对象的表面上的条形缺陷的形状模型,定量地确定检查对象的表面上的条形缺陷的形状。对象。;版权:(C)2007,JPO&INPIT

著录项

  • 公开/公告号JP2007178275A

    专利类型

  • 公开/公告日2007-07-12

    原文格式PDF

  • 申请/专利权人 TORAY IND INC;

    申请/专利号JP20050377515

  • 发明设计人 SAKUMA ATSUSHI;NAKAI YASUHIRO;

    申请日2005-12-28

  • 分类号G01B11/30;G01N21/892;

  • 国家 JP

  • 入库时间 2022-08-21 21:15:48

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