首页> 外国专利> RESISTANCE VALUE MEASURING SYSTEM, INSPECTION SYSTEM OF ELECTRIC CONNECTING POSITION USING IT, AND RESISTANCE VALUE MEASURING METHOD

RESISTANCE VALUE MEASURING SYSTEM, INSPECTION SYSTEM OF ELECTRIC CONNECTING POSITION USING IT, AND RESISTANCE VALUE MEASURING METHOD

机译:电阻值测量系统,使用该电阻值测量系统的电连接位置检查系统以及电阻值测量方法

摘要

PPROBLEM TO BE SOLVED: To provide a resistance value measuring system, capable of measuring a resistance value in a short time in all modes of a measuring resistance. PSOLUTION: This system comprises a bypass resistance RA connected in parallel to a measuring resistance RS and constituting a parallel circuit with the measuring resistance RS, a power source connected to the parallel circuit, a voltage changing means changing a voltage applied to the parallel circuit, an ammeter A measuring a current value of current carried in a predetermined position of the parallel circuit before and after the change of voltage applied to the parallel circuit by the voltage changing means, and a determination means determining a resistance value of the measuring resistance RS based on the current value measured by the ammeter A. PCOPYRIGHT: (C)2007,JPO&INPIT
机译:

要解决的问题:提供一种电阻值测量系统,该系统能够在所有测量电阻模式下在短时间内测量电阻值。解决方案:该系统包括与测量电阻RS并联并与测量电阻RS构成并联电路的旁路电阻RA,与并联电路连接的电源,电压改变装置,用于改变施加到测量电阻RS的电压。并联电路,电流表A,其测量在电压改变装置施加到并联电路的电压改变之前和之后在并联电路的预定位置中携带的电流的电流值,以及确定装置,确定测量的电阻值电阻RS基于电流表A测得的电流值。

版权所有:(C)2007,JPO&INPIT

著录项

  • 公开/公告号JP2007093575A

    专利类型

  • 公开/公告日2007-04-12

    原文格式PDF

  • 申请/专利权人 STAR MICRONICS CO LTD;

    申请/专利号JP20060049085

  • 发明设计人 NOZAWA AKIHIRO;

    申请日2006-02-24

  • 分类号G01R27/02;G01R31/04;

  • 国家 JP

  • 入库时间 2022-08-21 21:14:18

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