首页> 外国专利> MEMORY MODULE WITH FUNCTION OF DETECTING MEMORY ERROR AND FUNCTION OF DETECTING TEMPERATURE OF MEMORY CHIP

MEMORY MODULE WITH FUNCTION OF DETECTING MEMORY ERROR AND FUNCTION OF DETECTING TEMPERATURE OF MEMORY CHIP

机译:具有记忆误差检测功能和记忆芯片温度检测功能的记忆模块

摘要

PPROBLEM TO BE SOLVED: To provide a highly reliable memory module having the function of detecting memory errors and the function of detecting the temperature of memory chips. PSOLUTION: Both or either of an error detection circuit 5 and a temperature detection circuit 7 is mounted on the base 2 of the memory module 1. Detection of errors is effected by use of an ECC or parity check; when an error is detected, it is indicated in an error indicator 6 provided on the base 2. The temperature detection circuit 7 detects temperature, compares a preset temperature with the detected temperature, and controls the operation of a cooling apparatus according to the result of the comparison. PCOPYRIGHT: (C)2008,JPO&INPIT
机译:

要解决的问题:提供一种高度可靠的存储器模块,其具有检测存储器错误的功能和检测存储器芯片的温度的功能。解决方案:错误检测电路5和温度检测电路7中的一个或两个都安装在存储模块1的基座2上。当检测到错误时,在底座2上的错误指示器6中进行指示。温度检测电路7检测温度,将预设温度与检测到的温度进行比较,并根据检测结果控制冷却设备的运行。比较。

版权:(C)2008,日本特许厅&INPIT

著录项

  • 公开/公告号JP2007257062A

    专利类型

  • 公开/公告日2007-10-04

    原文格式PDF

  • 申请/专利权人 PRO SAIDO KK;

    申请/专利号JP20060077288

  • 发明设计人 SHIINA AKIYOSHI;

    申请日2006-03-20

  • 分类号G06F12/16;

  • 国家 JP

  • 入库时间 2022-08-21 21:13:37

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