首页> 外国专利> QUANTIFICATION OF MASS SPECTROMETRY USING TOTAL REFLECTION LASER IRRADIATION METHOD

QUANTIFICATION OF MASS SPECTROMETRY USING TOTAL REFLECTION LASER IRRADIATION METHOD

机译:全反射激光辐照法对质谱的定量分析

摘要

PROBLEM TO BE SOLVED: To quantitatively count the number of the molecules of a sample by irradiating the sample with evernescence light without using a matrix in mass spectrometry.;SOLUTION: A laser beam is introduced into a trapezoidal prism in parallel to the base of the prism and totally reflected by the inner surface of the base of the prism to generate evernescence light from the outer surface of the base. The sample applied to the outer surface is evaporated by the evernescence light to perform the quantitative analysis of the sample.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:在不使用基质的情况下,通过使用发散光照射样品来定量计算样品的分子数量,而无需在质谱仪中使用基质;解决方案:将激光束平行于样品的底部引入梯形棱镜中棱镜并被棱镜基座的内表面全反射,以从基座的外表面产生发光。照射到外表面的样品被发光光蒸发,对样品进行定量分析。;版权所有:(C)2007,日本专利商标局&INPIT

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