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The optical parameter measurement equipment and the multiple port optical device quality grasp method which use the concept of optical 'S' parameter

机译:使用光学“ S”参数概念的光学参数测量设备和多端口光学设备质量掌握方法

摘要

Management expedient of quality grasp process, the test light information of one or more (the alignment possible laser) source and the optical fiber in addition it includes various optical components, the optical circuit which forms inter- ferro- metric optical arrangement and the optical connector, photoelectric type interface, it consists of the digital electronic circuit and the capture electronic circuit for digital processing of optical detector, the analog electronic circuit and the signal, the test light information and the reference beam signal pass the plural distances of each length, this length being identical, even when is possible, the light information of the arm of inter- ferro- meter to differ, is modulated in phase and/or frequencyThe optical parameter measurement equipment and the multiple port optical device quality grasp method which use the concept of optical S parameter. This invention has the expedient which cuts off the influence of the vibration and temperature fluctuation. This invention the suffering test equipment by optical S parameter (DUT) is something which describes the light information transfer between the respective ports, each " Sxy " parameter is expressed Jones type (Jones queue) and/or Mueller type (Mueller queue) by. From queue of S parameter, bandwidth and phase, delay time, color dispersion, second next dispersed and reflectance ratio, reflection coefficient, from the y " port to " x " port, and transmissivity of its opposite direction, " x " port, and coefficient of permeability of its opposite direction, variation of insertion loss, polarized light dependence loss and polarized light type (DGD/PMD), the second next DGD and the like, all optical qualities of DUT derive from the y " port to. Selective figure Figure 1
机译:质量掌握过程的管理权宜之计,一个或多个(可能对准的激光)源和光纤的测试光信息,还包括各种光学组件,形成干涉光学装置的光学电路和光学连接器光电型接口,它由用于光检测器数字处理的数字电子电路和捕获电子电路,模拟电子电路和信号,测试光信息和参考光束信号通过每个长度的多个距离组成,长度相同,即使有可能,干涉仪臂的光信息也会有所不同,在相位和/或频率上进行调制使用了以下概念的光学参数测量设备和多端口光学设备质量掌握方法光学S参数。本发明具有消除振动和温度波动的影响的权宜之计。本发明的通过光学S参数(DUT)进行的痛苦测试设备描述了在各个端口之间的光信息传输,每个“ Sxy”参数分别表示为琼斯类型(琼斯队列)和/或穆勒类型(穆勒队列)。从S参数的队列,带宽和相位,延迟时间,色散,第二次色散和反射率,反射系数(从y“端口到” x“端口)以及其相反方向的透射率,” x“端口和相反方向的磁导率系数,插入损耗的变化,偏振光依赖性损耗和偏振光类型(DGD / PMD),第二次DGD等,DUT的所有光学品质都来自y“端口。图>图1

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