首页> 外国专利> SURFACE-COATED CERMET CUTTING TOOL HAVING HARD-COATING LAYER EXHIBITING EXCELLENT CHIPPING RESISTANCE IN HIGH-SPEED CUTTING OF DIFFICULT-TO-MACHINE MATERIAL

SURFACE-COATED CERMET CUTTING TOOL HAVING HARD-COATING LAYER EXHIBITING EXCELLENT CHIPPING RESISTANCE IN HIGH-SPEED CUTTING OF DIFFICULT-TO-MACHINE MATERIAL

机译:难切削材料的高速切削中具有硬涂层的表面涂层金属切削刀具具有出色的抗切削性

摘要

PROBLEM TO BE SOLVED: To provide a surface-coated cermet cutting tool having a hard-coating layer exhibiting excellent chipping resistance in high-speed cutting of a difficult-to-machine material.;SOLUTION: In production of a surface layer of the hard coating layer of the surface coated cermet cutting tool, every crystal grain having a hexagonal crystal lattice, present in a measurement range of a polishing surface, is irradiated with electron beams by using a field emission scanning electron microscope, and an inclination angle of a normal of a crystal plane of the crystal grain, with respect to a normal of the polishing surface, is measured. Then based on the measured inclination angle obtained as a result of the measurement, distribution of lattice points at which each constituent atom shares a single constituent atom between the crystal grain phases, in an interface between the crystal grains adjacent to each other, and provided that a constituent atom covalent lattice point form in which N lattice points sharing no constituent atom between the constituent atom covalent lattice points is represented by ΣN+1, the surface layer is formed of a modified Cr2O3 layer showing a constituent atom covalent lattice distribution graph in which a highest peak is present at Σ3, and at the same time a distribution percentage of Σ3 accounting for the entire amount of ΣN+1 is 60% or more.;COPYRIGHT: (C)2007,JPO&INPIT
机译:要解决的问题:提供一种具有硬涂层的表面涂层金属陶瓷切削工具,该涂层在高速切削难加工的材料时具有优异的抗崩刃性;解决方案:在生产硬质合金的表面层时使用场发射扫描电子显微镜,用电子束照射表面被覆金属陶瓷切削工具的被覆层,将存在于研磨面的测量范围内的具有六方晶格的每个晶粒照射电子束,使法线的倾斜角为测量晶粒的晶面相对于抛光表面的法线的角度。然后,基于作为测量结果而获得的测得的倾斜角,在彼此相邻的晶粒之间的界面中,各组成原子在晶粒相之间共享单个构成原子的晶格点的分布,并假定在组成原子共价晶格点之间不共享组成原子的N个晶格点由Σ N + 1表示的组成原子共价晶格点形式,表面层由改性Cr 2 O形成 3 层显示组成原子共价晶格分布图,其中最高峰出现在Σ 3处,同时Σ 3的分布百分比占Σ N的总量+1是60%或更高。;版权:(C)2007,日本特许厅和INPIT

著录项

  • 公开/公告号JP2007105807A

    专利类型

  • 公开/公告日2007-04-26

    原文格式PDF

  • 申请/专利权人 MITSUBISHI MATERIALS CORP;

    申请/专利号JP20050296421

  • 发明设计人 OSADA AKIRA;NAKAMURA KEIJI;HONMA HISASHI;

    申请日2005-10-11

  • 分类号B23B27/14;C23C16/40;

  • 国家 JP

  • 入库时间 2022-08-21 21:12:14

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