首页> 外国专利> WAFER-TYPE TEMPERATURE SENSOR, TEMPERATURE-MEASURING APPARATUS USING THE SAME, HEAT TREATMENT APPARATUS HAVING TEMPERATURE-MEASURING FUNCTION, AND TEMPERATURE-MEASURING METHOD

WAFER-TYPE TEMPERATURE SENSOR, TEMPERATURE-MEASURING APPARATUS USING THE SAME, HEAT TREATMENT APPARATUS HAVING TEMPERATURE-MEASURING FUNCTION, AND TEMPERATURE-MEASURING METHOD

机译:晶片型温度传感器,使用该温度传感器的温度测量装置,具有温度测量功能的热处理装置以及温度测量方法

摘要

PPROBLEM TO BE SOLVED: To provide a wafer-type temperature sensor of a simple circuit capable of eliminating the need for supply of electric power, adapting to automation, improving resistance to heat, and measuring the temperature distribution of a wafer. PSOLUTION: The wafer-type temperature sensor 10 is provided with the wafer 1 and a plurality of temperature sensors 2a, 2b, ..., each being arranged with the upper surface of the wafer 1 partitioned into a plurality of regions. The temperature sensors 2a, 2b, ... are each provided with a surface acoustic wave device for sending back frequency signals, based on the temperature of a corresponding region within a frequency band different region by region, in response to input of high-frequency signals. PCOPYRIGHT: (C)2007,JPO&INPIT
机译:

要解决的问题:提供一种具有简单电路的晶片型温度传感器,该传感器能够消除对电源的需求,适应自动化,提高耐热性并测量晶片的温度分布。

解决方案:晶片型温度传感器10设置有晶片1和多个温度传感器2a,2b,...,每个温度传感器布置成将晶片1的上表面划分为多个区域。温度传感器2a,2b,...分别设置有表面声波装置,该表面声波装置用于响应于高频的输入,基于不同区域的频带内的对应区域的温度,发送回频率信号。信号。

版权:(C)2007,日本特许厅&INPIT

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