首页> 外国专利> SYSTEM AND METHOD FOR SPECIFYING INFERIORITY CAUSE PROCESS, AND COMPUTER READABLE RECORDING MEDIUM RECORDING PROGRAM FOR CARRYING OUT THIS METHOD

SYSTEM AND METHOD FOR SPECIFYING INFERIORITY CAUSE PROCESS, AND COMPUTER READABLE RECORDING MEDIUM RECORDING PROGRAM FOR CARRYING OUT THIS METHOD

机译:指定自卑原因过程的系统和方法,以及执行该方法的计算机可读记录介质记录程序

摘要

PROBLEM TO BE SOLVED: To provide a system for specifying an inferiority cause process that can easily specify a process being the cause of inferiority occurrence in a manufacturing process for carrying out one or more processes for a substrate.;SOLUTION: The system 1 for specifying the inferiority cause process comprises an inspection information input part for inputting inspection information acquired to be inspected concerning one or more inferiority classifications in each closed region divided by the surface of the substrate after completing a prescribed process for the substrate, a map data creation part 14 for creating map data by accumulating data indicating a quality of an inspection result of each closed region on the substrate on one or more substrates processed in the manufacturing process concerning the inferiority classification designated out of a plurality of the inferiority classifications, and a characteristic extraction part 15 for extracting distribution of the closed region being inferiority on the substrate on the basis of the map data.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:提供一种用于指定次品原因过程的系统,该系统可以容易地指定在进行基板的一个或多个过程的制造过程中导致次品发生的原因的过程。解决方案:用于指定的系统1劣等原因处理包括:检查信息输入部分,用于在完成对基板的规定处理之后,输入除要被检查的检查信息以外的在每个封闭区域中被基板表面划分的每个或多个劣等类别的检查信息;地图数据创建部分14用于通过累积表示在多个劣等类别中指定的关于劣等类别的制造工艺中处理的一个或多个基板上的基板上的每个封闭区域的检查结果的质量的数据来创建地图数据,以及特征提取部15用于提取关闭的分布根据地图数据,d区域在基板上处于劣势。;版权所有:(C)2007,JPO&INPIT

著录项

  • 公开/公告号JP2007108117A

    专利类型

  • 公开/公告日2007-04-26

    原文格式PDF

  • 申请/专利权人 SHARP CORP;

    申请/专利号JP20050301642

  • 发明设计人 YAMAMOTO TOSHIO;

    申请日2005-10-17

  • 分类号G01R31/26;H01L21/66;G02F1/13;

  • 国家 JP

  • 入库时间 2022-08-21 21:11:48

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