首页> 外国专利> METHOD FOR PRODUCING EPITAXIAL WAFER FOR NITRIDE SEMICONDUCTOR LIGHT-EMITTING DIODE, EPITAXIAL WAFER FOR THE NITRIDE SEMICONDUCTOR LIGHT-EMITTING DIODE, AND THE NITRIDE SEMICONDUCTOR LIGHT-EMITTING DIODE

METHOD FOR PRODUCING EPITAXIAL WAFER FOR NITRIDE SEMICONDUCTOR LIGHT-EMITTING DIODE, EPITAXIAL WAFER FOR THE NITRIDE SEMICONDUCTOR LIGHT-EMITTING DIODE, AND THE NITRIDE SEMICONDUCTOR LIGHT-EMITTING DIODE

机译:氮化物半导体发光二极管的晶片制造方法,氮化物半导体发光二极管的晶片和氮化物半导体发光二极管的制造

摘要

PROBLEM TO BE SOLVED: To provide a process for producing an epitaxial wafer for nitride semiconductor light-emitting diode, in which a moderately roughened surface exhibiting high light take-out efficiency is provided, without bringing about increase in fabrication method and fabrication cost, as in the methods where wet etching or a resist pattern have been used for a long time.;SOLUTION: When at least one of a plurality of nitride semiconductor layers is grown epitaxially, a protruding and recessed surface having a level difference of 50 nm or larger is formed on the surface of the nitride semiconductor layer which is formed at the topmost part, while setting the mol ratio in supply of group-V material and group-III material to be 1,000 or smaller.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:提供一种用于氮化物半导体发光二极管的外延晶片的制造方法,其中提供了具有高的出光效率的适度粗糙化的表面,而不会导致制造方法和制造成本的增加。在长时间使用湿法蚀刻或抗蚀剂图案的方法中;解决方案:外延生长多个氮化物半导体层中的至少一层时,凹凸面的能级差为50 nm或更大在形成于最顶部的氮化物半导体层的表面上形成V,同时将V族材料和III族材料的供给中的摩尔比设定为1000或更小。版权所有:(C)2007,JPO&INPIT

著录项

  • 公开/公告号JP2006339427A

    专利类型

  • 公开/公告日2006-12-14

    原文格式PDF

  • 申请/专利权人 HITACHI CABLE LTD;

    申请/专利号JP20050162629

  • 发明设计人 FUJIKURA TSUNEAKI;

    申请日2005-06-02

  • 分类号H01L33/00;H01L21/205;

  • 国家 JP

  • 入库时间 2022-08-21 21:11:21

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