首页> 外国专利> METHOD FOR INSPECTING TRANSLUCENT ARTICLE MADE OF TRANSLUCENT MATERIAL, METHOD AND APPARATUS FOR INSPECTING DEFECT OF GLASS SUBSTRATE, GLASS SUBSTRATE FOR MASK BLANK, AND MANUFACTURING METHOD THEREFOR, MASK BLAND AND MANUFACTURING METHOD THEREFOR, MASK FOR EXPOSURE AND MANUFACTURING METHOD THEREFOR, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

METHOD FOR INSPECTING TRANSLUCENT ARTICLE MADE OF TRANSLUCENT MATERIAL, METHOD AND APPARATUS FOR INSPECTING DEFECT OF GLASS SUBSTRATE, GLASS SUBSTRATE FOR MASK BLANK, AND MANUFACTURING METHOD THEREFOR, MASK BLAND AND MANUFACTURING METHOD THEREFOR, MASK FOR EXPOSURE AND MANUFACTURING METHOD THEREFOR, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

机译:半透明材料制成的半透明物品的检查方法,玻璃基板的缺陷,玻璃基板的坯料的缺陷的检查方法及装置,制造方法,制造方法,制造方法,制造方法,制造方法,制造方法半导体器件

摘要

PROBLEM TO BE SOLVED: To provide a translucent article inspection method, capable of accurately inspecting the presence or the absence of optical inhomogeneity in translucent articles.;SOLUTION: When an inspection light, having a wavelength of 200 nm or shorter, is introduced to a translucent article and that a section of which optical characteristics partly or locally change is present in an optical path, through which the inspection by detecting light propagates inside the translucent article, by detecting light emitted from the section and having wavelength longer than that of the inspection light is sensed, to inspect the presence or absence of optical homogeneity in the translucent article.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:提供一种半透明的物品检查方法,该方法能够准确地检查半透明物品中是否存在光学不均匀性。;解决方案:将波长为200 nm或更短的检查光引入到半透明物品中时。半透明物品,并且在光学路径中存在光学特性部分或局部改变的部分,通过检测光来进行检查的检查通过半透明物品在半透明物品内部传播,通过检测从该部分发出的波长比检查长的光来进行感测光,以检查半透明物品中是否存在光学均匀性。;版权所有:(C)2007,JPO&INPIT

著录项

  • 公开/公告号JP2007086050A

    专利类型

  • 公开/公告日2007-04-05

    原文格式PDF

  • 申请/专利权人 HOYA CORP;

    申请/专利号JP20060042996

  • 发明设计人 TANABE MASARU;

    申请日2006-02-20

  • 分类号G01N21/958;G03F1/08;G01N21/64;

  • 国家 JP

  • 入库时间 2022-08-21 21:10:40

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