首页> 外国专利> EVALUATION METHOD FOR BISMUTH-SUBSTITUTED RARE-EARTH IRON GARNET MEMBRANE CHIP

EVALUATION METHOD FOR BISMUTH-SUBSTITUTED RARE-EARTH IRON GARNET MEMBRANE CHIP

机译:铋取代稀土石榴石膜片的评价方法

摘要

PROBLEM TO BE SOLVED: To provide a method with an easy process for evaluating quality of bismuth-substituted rare-earth iron garnet membrane chip obtained by cutting bismuth-substituted rare-earth iron garnet membrane of which the magnetically saturated state is maintained without any exterior magnetic field, into small chips.;SOLUTION: The evaluation method is for bismuth-substituted rare-earth iron garnet membrane obtained by cutting a wafer 1 of the bismuth-substituted rare-earth iron garnet membrane into small chips. After obtaining the chips of bismuth-substituted rare-earth iron garnet membrane by cutting into small chips, the magnetized bismuth-substituted rare-earth iron garnet membrane, a magnetic field, which is smaller than the coercive force that the bismuth-substituted rare-earth iron garnet membrane originally has, is impressed in reverse direction to the magnetized direction to the chip. Then, quality of the chip is judged by microscope observation.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:提供一种方法,该方法通过简单的方法来评估通过切割保持磁性饱和状态且没有任何外部影响的铋取代稀土铁石榴石膜而获得的铋取代稀土铁石榴石膜芯片的质量。解决方案:该评估方法适用于将铋取代稀土铁石榴石膜的晶片1切成小碎片而获得的铋取代稀土铁石榴石膜。将铋取代稀土铁石榴石膜切成小块后,将其磁化后的磁场强度比铋取代稀土铁石榴石膜的矫顽力小。原来的铁石榴石膜,以与磁化方向相反的方向施加到芯片上。然后,通过显微镜观察来判断芯片的质量。;版权所有:(C)2007,日本特许会计师事务所

著录项

  • 公开/公告号JP2007033234A

    专利类型

  • 公开/公告日2007-02-08

    原文格式PDF

  • 申请/专利权人 GRANOPT LTD;

    申请/专利号JP20050216950

  • 发明设计人 KISHIMOTO TOSHIKI;ASAHARA YOSUKE;

    申请日2005-07-27

  • 分类号G01M11/00;

  • 国家 JP

  • 入库时间 2022-08-21 21:10:00

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号