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Connection state detection circuit and IC chip built-in medium provided with the connection state detection circuit

机译:连接状态检测电路和具有该连接状态检测电路的IC芯片内置介质

摘要

PROBLEM TO BE SOLVED: To suppress the power consumption, and to improve the reliability. SOLUTION: When the applied timing signal from an IC control part 101 is in an enable condition, a PMOS transistor 20 for a pull-up resistor is in an energized condition through an inverter circuit 10. When a wire 80 to be detected is connected, the divided resistance voltage to be inputted in an AND circuit 70 through an intermediate lead is higher than the logical threshold at the AND circuit 70, and the connection condition signal to be outputted is on the HIGH level. When the wire 80 to be detected is disconnected, the divided resistance voltage to be inputted in the AND circuit 70 is only dependent on an NMOS transistor 60 for a pull-down resistor, and since the divided resistance voltage is lower than the logical threshold at the AND circuit 70, the connection condition signal to be outputted from the AND circuit 70 is on the LOW level. Thus, the connection or disconnection can be judged.
机译:要解决的问题:抑制功耗并提高可靠性。解决方案:当从IC控制部分101施加的定时信号处于启用状态时,用于上拉电阻的PMOS晶体管20通过反相器电路10处于通电状态。当连接要检测的导线80时,通过中间引线输入到“与”电路70中的分压电阻电压高于“与”电路70处的逻辑阈值,并且要输出的连接条件信号处于高电平。当待检测的电线80断开时,要输入到AND电路70中的分压电阻电压仅取决于用于下拉电阻的NMOS晶体管60,并且由于分压电阻电压低于逻辑阈值在与电路70中,从与电路70输出的连接条件信号为低电平。因此,可以判断连接或断开。

著录项

  • 公开/公告号JP3896698B2

    专利类型

  • 公开/公告日2007-03-22

    原文格式PDF

  • 申请/专利权人 株式会社デンソー;

    申请/专利号JP19980235843

  • 发明设计人 我妻 秀治;北村 哲康;

    申请日1998-08-21

  • 分类号G01R31/02;G06K19/07;

  • 国家 JP

  • 入库时间 2022-08-21 21:08:18

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