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Method of measuring the refractive index distribution and composition ratio distributions of the optical crystal wafer
Method of measuring the refractive index distribution and composition ratio distributions of the optical crystal wafer
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机译:测量光学晶体晶片的折射率分布和组成比分布的方法
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摘要
PROBLEM TO BE SOLVED: To measure a refractive-index distribution of a sample by a higher- accuracy and quick method without being influenced by a distribution of a wafer thickness in view of a problem of a conventional technique.;SOLUTION: An apparatus for measuring the refractive-index distribution by using a z-cut 5-inch LiNbO3 wafer is arranged as shown in the figure. In order to measure a transmitted-wave-front strain (an optical path length), an interferometer made by ZYGO Company is used. A polarization state in a measurement is changed over. A reflecting mirror 3 is mounted on a mirror mount 4 to which a tilt adjustment is attached, and a tilt is adjusted by tilt adjusting screws 5, 6, 7. The optical systems are arranged on a vibration-proof optical surface plate, and the whole is arranged inside a clean bench controlled at 0.1°C.;COPYRIGHT: (C)2004,JPO
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