首页> 外国专利> Methods for wafer-level packaging of microfeature devices and microfeature devices formed using such methods

Methods for wafer-level packaging of microfeature devices and microfeature devices formed using such methods

机译:晶片级封装的微特征器件的方法以及使用该方法形成的微特征器件

摘要

Methods for wafer-level packaging of microfeature devices and microfeature devices formed using such methods are disclosed herein. A method for packaging microfeature devices in accordance with an embodiment of the invention can include releasably attaching a plurality of first known good microelectronic dies to a carrier substrate in a desired arrangement. In several embodiments, for example, the first dies can be releasably attached to an attachment feature on the carrier substrate. The method can also include attaching one or more second known good microelectronic dies to the individual first dies in a stacked configuration to form a plurality of stacked devices. The method further includes at least partially encapsulating the stacked devices and separating the stacked devices from each other.
机译:本文公开了晶片级封装的微特征器件的方法以及使用这种方法形成的微特征器件。根据本发明的实施例的用于包装微特征器件的方法可以包括以期望的布置将多个第一已知良好的微电子管芯可释放地附接到载体衬底。例如,在几个实施例中,第一管芯可以可释放地附接到载体基板上的附接特征。该方法还可以包括以堆叠配置将一个或多个第二已知良好的微电子管芯附接到各个第一管芯以形成多个堆叠器件。该方法还包括至少部分地封装堆叠的器件并使堆叠的器件彼此分离。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号