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Cell library database and timing verification and withstand voltage verification systems for integrated circuit using the same

机译:单元库数据库以及使用其的集成电路时序验证和耐压验证系统

摘要

In a cell library database, timing verification is conducted on an LSI which exists in a variable power supply system capable of changing the source voltage arbitrarily and which includes logic delay information associated with a plurality of source voltages. The database is configured, for example, so that the voltage information V of the source is represented in multiple bits V [1:0] and delay times Alh (Vlh) to Bhl (Vhh) between the time input signals A and B are each changed and the time the output signal Y changes are described for respective pieces of source voltage information LH (1.2 V), HL (1.5 V) and HH (1.8 V). This allows timing verification in the variable source system which operates with the source voltage changed dynamically.
机译:在单元库数据库中,对存在于能够任意改变电源电压的可变电源系统中的LSI进行定时验证,该LSI包括与多个电源电压相关的逻辑延迟信息。例如,数据库被配置为使得源的电压信息V以多个位V [1:0]表示,并且在时间A和B之间的延迟时间Alh(Vlh)至Bhl(Vhh)分别是分别针对源电压信息LH(1.2 V),HL(1.5 V)和HH(1.8 V)分别描述改变和输出信号Y改变的时间。这允许在源电压动态变化的可变源系统中进行时序验证。

著录项

  • 公开/公告号US7257801B2

    专利类型

  • 公开/公告日2007-08-14

    原文格式PDF

  • 申请/专利权人 SHIRO SAKIYAMA;KOUJI MOCHIZUKI;

    申请/专利号US20030630803

  • 发明设计人 SHIRO SAKIYAMA;KOUJI MOCHIZUKI;

    申请日2003-07-31

  • 分类号G06F17/50;

  • 国家 US

  • 入库时间 2022-08-21 21:02:40

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