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Device design-for-test and burn-in-board with minimal external components and increased testing capacity
Device design-for-test and burn-in-board with minimal external components and increased testing capacity
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机译:用于测试的设备设计和板载老化,具有最少的外部组件和增加的测试能力
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摘要
The invention includes a design for device design-for-test and a burn-in-board that reduce the number of external components per device on the board. Inputs to the I/Os of a device from input means are inverted between pairs of output pins. A single resister is coupled between an output that is true (e.g., not inverted) and an output that is inverted. Thus, instead of using one or more resistors per I/O from the DUT, a single resister can be coupled between inverted and non-inverted outputs.
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