首页> 外国专利> Imaging systems for fluorescence and reflectance imaging and spectroscopy and for contemporaneous measurements of electromagnetic radiation with multiple measuring devices

Imaging systems for fluorescence and reflectance imaging and spectroscopy and for contemporaneous measurements of electromagnetic radiation with multiple measuring devices

机译:成像系统,用于荧光和反射成像和光谱分析,以及使用多个测量设备同时测量电磁辐射

摘要

Optical systems that provide for simultaneous images and spectra from an object, such as a tissue sample, an industrial object such as a computer chip, or any other object that can be viewed with an optical system such as a microscope, endoscope, telescope or camera. In some embodiments, the systems provide multiple images corresponding to various desired wavelength ranges within an original image of the object, as well as, if desired, directional pointer(s) that can provide both an identification of the precise location from which a spectrum is being obtained, as well as enhancing the ability to point the device.
机译:光学系统可同时提供对象(例如组织样本),工业对象(例如计算机芯片)或任何其他可以用光学系统(例如显微镜,内窥镜,望远镜或照相机)观察到的图像和光谱。在一些实施例中,系统提供与物体的原始图像内的各种期望的波长范围相对应的多个图像,以及如果需要的话,可以提供对光谱的精确位置的识别的定向指针。以及增强指向设备的能力。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号