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Beam current measuring device and apparatus using the same

机译:束流测量装置及使用该束流测量装置的装置

摘要

A beam current measuring device (BMD) capable of measuring beam current while radiating the beam on a target, such as a semiconductor wafer. The BMD at least includes: (a) a detecting part operable to detect or collect a magnetic field corresponding to the beam current; and (b) a measuring part including (i) a SQUID sensitive to magnetic flux, and (ii) a feedback coil operable to carry feedback current wherein the feedback current is operable to cancel out a change in the magnetic flux penetrating through the SQUID. Wherein the operating point of the SQUID is set according to a finite beam current value, other than zero, which penetrates through the detecting part.;A BMD of the present invention can be incorporated and used in an ion-implantation apparatus, an electron beam exposure apparatus, an accelerator, and the like.
机译:束电流测量装置(BMD),能够在将束辐射到诸如半导体晶片的目标上时测量束电流。该BMD至少包括:(a)检测部分,其可操作以检测或收集与束电流相对应的磁场; (b)测量部件,其包括(i)对磁通量敏感的SQUID,和(ii)可操作以承载反馈电流的反馈线圈,其中该反馈电流可用于抵消穿过SQUID的磁通量的变化。其中,SQUID的工作点根据穿透检测部分的有限的除零以外的束流电流值来设定。本发明的BMD可以结合并用于离子注入装置中,电子束曝光设备,加速器等。

著录项

  • 公开/公告号US7161352B2

    专利类型

  • 公开/公告日2007-01-09

    原文格式PDF

  • 申请/专利权人 YUICHIRO SASAKI;

    申请/专利号US20040023495

  • 发明设计人 YUICHIRO SASAKI;

    申请日2004-12-29

  • 分类号G01R31/00;G01R33/02;

  • 国家 US

  • 入库时间 2022-08-21 20:59:48

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