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Micro structure, cantilever, scanning probe microscope and a method for measuring deformation quantity for the micro structure
Micro structure, cantilever, scanning probe microscope and a method for measuring deformation quantity for the micro structure
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机译:微观结构,悬臂,扫描探针显微镜以及测量该微观结构的变形量的方法
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摘要
It is desired that highly efficient and highly sensitive sensors being extremely small size is provided in desired position, desired shape and size for a micro structure that causes the elastic deformation at least a part thereof. Moreover, it is also required that facilitating to assemble and adjust the components, miniaturizing and simplifying the detection circuit, and measuring a local displacement of a fine part of the micro structure.;The disclosing micro structure is cantilever 1 which beam part 14 causes the elastic deformation. This cantilever 1 is provided with a sensor 12 detecting elastic deformation of beam part 14 by tunneling effect.
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