首页> 外国专利> HIGHLY DIELECTRIC FILM, AND UTILIZING THE SAME, FIELD-EFFECT TRANSISTOR AND SEMICONDUCTOR INTEGRATED CIRCUIT APPARATUS, AND PROCESS FOR PRODUCING THE HIGHLY DIELECTRIC FILM

HIGHLY DIELECTRIC FILM, AND UTILIZING THE SAME, FIELD-EFFECT TRANSISTOR AND SEMICONDUCTOR INTEGRATED CIRCUIT APPARATUS, AND PROCESS FOR PRODUCING THE HIGHLY DIELECTRIC FILM

机译:高介电薄膜,并利用相同的场效应晶体管和半导体集成电路装置,以及生产高介电薄膜的方法

摘要

A high-dielectric-constant film including hafnium, wherein the above-mentioned high-dielectric-constant film includes deuterium at a ratio higher than the ratio of deuterium to hydrogen present in nature. In a field-effect transistor provided with the high-dielectric-constant film including hafnium, the interface state density at the interface between a silicon substrate and a gate dielectric film decreases and carrier mobility in the gate dielectric film increases. In the present invention, a high-dielectric-constant constant second dielectric film, which is a thin film including hafnium such as HfSiON or HfAlOx and including deuterium at a ratio higher than the ratio of deuterium to hydrogen present in nature, is used as the gate dielectric film of the field-effect transistor.
机译:一种包含ha的高介电常数薄膜,其中上述高介电常数薄膜包含氘的比率高于自然界中存在的氘与氢的比率。在具有包括including的高介电常数膜的场效应晶体管中,硅基板与栅极介电膜之间的界面处的界面态密度降低,并且栅极介电膜中的载流子迁移率增加。在本发明中,使用高介电常数的第二介电膜作为薄膜,该薄膜包括诸如HfSiON或HfAlOx之类的and并且以高于自然界中存在的氘与氢之比的比率包含氘的薄膜。场效应晶体管的栅极介电膜。

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