首页> 外国专利> PARTICLE ADSORPTION CHAMBER AND PARTICLE SAMPLING APPARATUS AND PARTICLE SAMPLING METHOD

PARTICLE ADSORPTION CHAMBER AND PARTICLE SAMPLING APPARATUS AND PARTICLE SAMPLING METHOD

机译:颗粒吸附室和颗粒取样装置及颗粒取样方法

摘要

The present invention relates to particle adsorption chamber, the particle sampling apparatus, and a particle sampling method, the body can hold a sucker of particles to adsorb, is installed inside the body interior of a support portion for supporting the suction plates, said body using the cover, the particle adsorption chamber containing the porous plate to stabilize the stream of air flowing into the interior of the body to seal and characterized in that the adsorption particles. With this structure, it is possible not only by size measurement of the particle number can analyze even the shape and components of particles. Accordingly, it is possible to trace the cause of the particle analysis. ; Semiconductor, cleanliness, GAST pumps, sampling, particle counter
机译:颗粒吸附室,颗粒采样装置和颗粒采样方法技术领域本发明涉及颗粒吸附室,颗粒采样装置和颗粒采样方法,该本体可以保持颗粒吸盘以进行吸附,该本体安装在用于支撑吸盘的支撑部分的内部内部,所述本体使用在盖上,颗粒吸附室包含多孔板,以稳定流入主体内部的空气流以密封,其特征在于吸附颗粒。利用这种结构,不仅可以通过颗粒数目的尺寸测量甚至可以分析颗粒的形状和成分。因此,可以追踪颗粒分析的原因。 ;半导体,清洁度,GAST泵,采样,粒子计数器

著录项

  • 公开/公告号KR100727487B1

    专利类型

  • 公开/公告日2007-06-13

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20050108703

  • 申请日2005-11-14

  • 分类号H01L21/02;

  • 国家 KR

  • 入库时间 2022-08-21 20:32:00

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号