TRANSFERRING METHOD OF TEST TRAYS IN SIDE-DOCKING TYPE TEST HANDLER AND OPERATING METHOD OF SIDE-DOCKING TYPE TEST HANDLER

摘要

A method for transferring test trays in a side-docking type test handler and an operation method of a side-docking type test handler are provided to improve the processing speed of the test handler by not locating the new test tray on a basic circular path. A method for transferring test trays in a side-docking type test handler includes the steps of: changing the position of the test tray into a vertical state by rotating the test tray gradually at a predetermined angle before transferring the test tray of a horizontal state from a loading position for loading a semiconductor device to a test position(S203); transferring the test tray of which the position is changed to the test position(S205); changing the position of the test tray into the horizontal state before transferring the test tray to an unloading position for unloading the semiconductor device loaded from the test position(S208); transferring the test tray of which the position is changed to the unloading position(S210); and transferring the unloaded test tray from the unloading position to the loading position(S211).