首页> 外国专利> Method and apparatus for calibrating a measuring device path, and means for measuring the s - parameters of a test device in the calibrated measuring device path

Method and apparatus for calibrating a measuring device path, and means for measuring the s - parameters of a test device in the calibrated measuring device path

机译:用于校准测量设备路径的方法和设备,以及用于在校准的测量设备路径中测量测试设备的s参数的装置

摘要

A method for calibrating a first and a second adapter, comprising the steps of:Calibrating (801) of coaxial ports of a vector network analyzer of the workpiece, on which can be led back standards,Switching (802) of a symmetrical by gear circuit path (102) between the coaxial ports, wherein the output circuit by means of a cascaded combination of a first and a second circuit path by means of gear adapter, wherein said first circuit path by means of gear adapter passively and substantially identical to the second circuit path adapter by means of gear, wherein, a measuring device path (104) a first and a second adapter, which are not arranged in a cascading manner, wherein the gear circuit path (102) and the measuring device path (104) substantially equivalent s - parameters have,Measuring (802) of s - parameters of the circuit path (102 by gear),Characterize (803) of the first and the second adapter on the basis of the s - parameters.
机译:一种用于校准第一适配器和第二适配器的方法,包括以下步骤:校准(801)工件的矢量网络分析仪的同轴端口,可以在其上引入标准;通过齿轮电路进行对称的切换(802)。同轴端口之间的路径(102),其中输出电路借助于齿轮适配器的第一和第二电路路径的级联组合,其中借助于齿轮适配器的所述第一电路路径被动地且基本上与第二电路路径相同通过齿轮的电路路径适配器,其中,测量设备路径(104),第一和第二适配器,它们不是以级联方式布置的,其中,齿轮电路路径(102)和测量设备路径(104)基本上是等效s-参数具有s-测量路径的参数(802通过齿轮),根据s-参数对第一和第二适配器的特征化(803)。

著录项

  • 公开/公告号DE10338072B4

    专利类型

  • 公开/公告日2007-02-08

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE2003138072

  • 发明设计人

    申请日2003-08-19

  • 分类号G01R35/00;G01R27/28;

  • 国家 DE

  • 入库时间 2022-08-21 20:30:05

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