首页>
外国专利>
Workpiece shape sampling procedure determines vertical position of probe tip by addition of vertical heigh of measurement unit support, base, constant and calculated probe arm tip height
Workpiece shape sampling procedure determines vertical position of probe tip by addition of vertical heigh of measurement unit support, base, constant and calculated probe arm tip height
A workpiece shape sampling procedure determines the vertical position of the probe (7) tip (1) by addition of the vertical height of the measurement unit support (6) and base (3), a constant and the product of the distance (L) of the tip from the the probe arm (9) centre of rotation (11) and the sine of the rotation angle. Independent claims are included for a measurement unit using the procedure.
展开▼