首页> 外国专利> Workpiece shape sampling procedure determines vertical position of probe tip by addition of vertical heigh of measurement unit support, base, constant and calculated probe arm tip height

Workpiece shape sampling procedure determines vertical position of probe tip by addition of vertical heigh of measurement unit support, base, constant and calculated probe arm tip height

机译:工件形状采样程序通过添加测量单元支架的垂直高度,基准,常数和计算出的探针臂尖端高度来确定探针尖端的垂直位置

摘要

A workpiece shape sampling procedure determines the vertical position of the probe (7) tip (1) by addition of the vertical height of the measurement unit support (6) and base (3), a constant and the product of the distance (L) of the tip from the the probe arm (9) centre of rotation (11) and the sine of the rotation angle. Independent claims are included for a measurement unit using the procedure.
机译:工件形状采样过程通过加上测量单元支架(6)和底座(3)的垂直高度,常数和距离(L)的乘积来确定探针(7)尖端(1)的垂直位置探针从探针臂(9)的旋转中心(11)的角度和旋转角度的正弦值开始计算。使用该程序的测量单位包括独立权利要求。

著录项

  • 公开/公告号DE102005031796A1

    专利类型

  • 公开/公告日2007-01-11

    原文格式PDF

  • 申请/专利权人 T & S GESELLSCHAFT FUER LAENGENPRUEFTECHNIK MBH;

    申请/专利号DE20051031796

  • 发明设计人 HOERMANN RALF;

    申请日2005-07-07

  • 分类号G01B5/20;G01B5/004;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:56

相似文献

  • 专利
  • 外文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号