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Difference comparator circuit, test head and testing device

机译:差比较器电路,测试头和测试装置

摘要

There is provided a differential comparator circuit that is mounted on a test apparatus for testing a device under test outputting differential signals including noninverted signals and inverted signals. The differential comparator circuit includes: a difference signal subtracting circuit operable to compute and output a difference signal indicative of a difference between the noninverted signal and the inverted signal; a first threshold value subtracting circuit operable to compute and output a first threshold voltage indicative of a difference between a first comparative voltage generated based on ground potential of the device under test and a reference voltage generated based on the ground potential of the device under test; and a first comparing circuit operable to compare the difference signal and the first threshold voltage to output a comparison result.
机译:提供了一种差分比较器电路,该差分比较器电路安装在测试设备上,该测试设备用于测试输出包括同相信号和反相信号的差分信号的被测设备。差分比较器电路包括:差分信号减法电路,用于计算并输出指示同相信号和反相信号之间的差异的差分信号;以及第一阈值减法电路,用于计算并输出第一阈值电压,该第一阈值电压指示基于被测器件的地电位产生的第一比较电压与基于被测器件的地电位产生的参考电压之间的差;第一比较电路,用于比较差信号和第一阈值电压以输出比较结果。

著录项

  • 公开/公告号DE112005001957T5

    专利类型

  • 公开/公告日2007-07-26

    原文格式PDF

  • 申请/专利权人 ADVANTEST CORP.;

    申请/专利号DE20051101957

  • 发明设计人

    申请日2005-08-08

  • 分类号H03K5/08;G01R19/165;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:32

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