首页> 外国专利> Projection objective for microlithographic projection exposure apparatus, has optical subsystem that projects intermediate image into image-plane with image-plane side projection ratio of specific value

Projection objective for microlithographic projection exposure apparatus, has optical subsystem that projects intermediate image into image-plane with image-plane side projection ratio of specific value

机译:用于微光刻投影曝光设备的投影物镜,具有光学子系统,该光学子系统将中间图像以特定值的像平面侧投影比投影到像平面中

摘要

The objective (100) produces an intermediate image (IMI) and comprises an optical subsystem (130) on an image-plane side that projects the IMI into an image-plane (IP) with an image-plane side projection ratio. The ratio has an absolute value of 0.3. An independent claim is included for micro-structured component manufacturing method.
机译:物镜(100)产生中间图像(IMI)并且在像平面侧上包括光学子系统(130),该光学子系统将IMI投影到具有像平面侧投影比的像平面(IP)中。该比率的绝对值为0.3。对于微结构部件的制造方法包括独立权利要求。

著录项

  • 公开/公告号DE102006038454A1

    专利类型

  • 公开/公告日2007-07-05

    原文格式PDF

  • 申请/专利权人 CARL ZEISS SMT AG;

    申请/专利号DE20061038454

  • 申请日2006-08-16

  • 分类号G02B13/14;G03F7/20;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:13

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