首页> 外国专利> Semiconductor component e.g. static random access memory, manufacturing method, involves forming set of ditches by selective etching of insulating layer using set of photoresist structures, and forming metallic connection in each ditch

Semiconductor component e.g. static random access memory, manufacturing method, involves forming set of ditches by selective etching of insulating layer using set of photoresist structures, and forming metallic connection in each ditch

机译:半导体元件静态随机存取存储器的制造方法,涉及通过使用一组光致抗蚀剂结构对绝缘层进行选择性蚀刻来形成一组沟槽,并在每个沟槽中形成金属连接

摘要

The method involves preparing a substrate that contains a set of conductive structures, and forming an insulating layer on the substrate. A set of ditches is formed by selective etching of the insulating layer using a set of photoresist structures as an etching mask. The insulating layer is arranged between the formed ditches. A metallic connection in each ditch is formed, where a width of the insulating layer is provided in a range from 0.185 micrometer to 0.225 micrometer.
机译:该方法包括准备包含一组导电结构的衬底,并在该衬底上形成绝缘层。使用一组光致抗蚀剂结构作为蚀刻掩模,通过对绝缘层进行选择性蚀刻来形成一组沟槽。绝缘层布置在形成的沟槽之间。在每个沟槽中形成金属连接,其中绝缘层的宽度设置在0.185微米至0.225微米的范围内。

著录项

  • 公开/公告号DE102006053926A1

    专利类型

  • 公开/公告日2007-06-28

    原文格式PDF

  • 申请/专利权人 DONGBU ELECTRONICS CO. LTD.;

    申请/专利号DE20061053926

  • 发明设计人 HONG JI HO;

    申请日2006-11-15

  • 分类号H01L21/768;H01L21/66;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:09

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